View Generic Document: Using thickness variation and interface chemistry to manipulate microstructure in thin Silver films
Citation:
Ballard, Daniel (2007). Using thickness variation and interface chemistry to manipulate microstructure in thin Silver films. Cornell Center for Materials Research.
When thin Silver films (nominally 100nm to 2000nm) are thermally cycled, the resulting microstructure has a preferred orientation dependent on thickness. There may be nominal
dependency on an interface layer of Ti, but that is yet to be determined conclusively. When the Ag is at a thickness of about 1 μm, the texture starts to change from predominantly (111) orientation
to predominantly (100) orientation. When the thickness reaches about 1.5 μm, the volume fraction of (100) orientation to (111) approaches 90- 95% and continues to rise to values of 98% or more at
thicknesses ≥ 2μm
Publisher
Cornell Center for Materials Research
Date
2007-08-29
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Support for the CCMR is provided through the NSF Grant DMR 0520404, part of the NSF MRSEC Program. Additional support is provided by Cornell University, the State of New York, and
by industrial sources.
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View Generic Document: Using thickness variation and interface chemistry to manipulate microstructure in thin Silver films 