Sample Preparation of Thin Silver Films for Transmission Electron Microscopy

Guest - January 10, 2009

Browse Communities | ^NEW Participate | Login |

Help

View Generic Document: Sample Preparation of Thin Silver Films for Transmission Electron Microscopy

Citation:	Aikens, Kurt (2007). Sample Preparation of Thin Silver Films for Transmission Electron Microscopy. Cornell Center for Materials Research.
Collection:	Cornell Center for Materials Research REU Program

Title	Sample Preparation of Thin Silver Films for Transmission Electron Microscopy
Author(s)	Aikens, Kurt
Keyword(s)	Sample Preparation transmission electron microscopy TEM wedge polishing dimpling ion-milling dimple grinding thin silver films thin films
Abstract/Summary	Two different approaches are outlined for the sample preparation of deposited thin silver metal films for use in a transmission electron microscope. Wedge polished cross-section samples and dimpled samples have the ability to reveal many of the characteristics of how thin silver films form. These samples are ion-milled as a final step to producing a sample for the TEM.
Publisher	Cornell Center for Materials Research
Date	2007-08-29
Copyright Notice	Copyright 2007 CCMR. Materials from the CCMR website may not be used without permission.
Copyright Agreement	on
Additional Notes	Support for the CCMR is provided through the NSF Grant DMR 0520404, part of the NSF MRSEC Program. Additional support is provided by Cornell University, the State of New York, and by industrial sources.

Created:

Fri, 18 Jan 2008, 06:36:11 EST by Cathy Lowe. Detailed History