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View Journal Article: Morphological Characterization of Symmetric Diblock Copolymers Via Novel Combinatorial Methods

Citation: Smith, Archie, Meredith, J. Carson, Amis, Eric and Karim, Alamgir (2000). Morphological Characterization of Symmetric Diblock Copolymers Via Novel Combinatorial Methods. Polymeric Materials: Science & Engineering 83 (). 484-485.
Collection: Polymer Publications  
 
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Title Morphological Characterization of Symmetric Diblock Copolymers Via Novel Combinatorial Methods
Author(s) Smith, Archie
Meredith, J. Carson
Amis, Eric
Karim, Alamgir
Keyword(s) combinatorial methods
thin films
polystyrene-b-poly(methyl methacrylate)
PS-b-PMMA
atomic force microscopy
AFM
Abstract/Summary We have developed a technique to create polymer thin films with a controlled, continuous gradient in film thickness. As a demonstration of the utility of this technique, we have revisited the well-studied phenomena of the morphology of symmetric diblock copolymer thin films.
Publisher American Chemical Society
Date 2000-01-01
Copyright Notice http://www.nist.gov/public_affairs/disclaim.htm
Journal Polymeric Materials: Science & Engineering
Volume 83
Pages 484-485
Copyright Agreement on
Additional Notes Polymeric Materials: Science & Engineering 2000, 83, 484
 
 
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Created: Tue, 31 Oct 2006, 00:58:01 EST Detailed History


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