View Journal Article: Morphological Characterization of Symmetric Diblock Copolymers Via Novel Combinatorial Methods
Citation:
Smith, Archie, Meredith, J. Carson, Amis, Eric and Karim, Alamgir (2000). Morphological Characterization of Symmetric Diblock Copolymers Via Novel Combinatorial Methods. Polymeric Materials: Science & Engineering 83 (). 484-485.
Collection:
Polymer Publications
Title
Morphological Characterization of Symmetric Diblock Copolymers Via Novel Combinatorial Methods
Author(s)
Smith, Archie Meredith, J. Carson Amis, Eric Karim, Alamgir
Keyword(s)
combinatorial methods thin films polystyrene-b-poly(methyl methacrylate) PS-b-PMMA atomic force microscopy AFM
Abstract/Summary
We have developed a technique to create polymer thin films with a controlled, continuous gradient in film thickness. As a demonstration of the utility of this technique, we have
revisited the well-studied phenomena of the morphology of symmetric diblock copolymer thin films.
Publisher
American Chemical Society
Date
2000-01-01
Copyright Notice
http://www.nist.gov/public_affairs/disclaim.htm
Journal
Polymeric Materials: Science & Engineering
Volume
83
Pages
484-485
Copyright Agreement
on
Additional Notes
Polymeric Materials: Science & Engineering 2000, 83, 484