View Journal Article: Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High-Throughput Characterization of Biosurfaces
Citation:
Roberson, Sonya, Sehgal, Amit, Fahey, A. and Karim, Alamgir (2003). Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High-Throughput Characterization of Biosurfaces. Applied Surface Science 203-204 (). 855-858.
Collection:
Polymer Publications
Title
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High-Throughput Characterization of Biosurfaces
Author(s)
Roberson, Sonya Sehgal, Amit Fahey, A. Karim, Alamgir
Keyword(s)
combinatorial methods TOF-SIMS UV-ozone treatment Surface energy gradient Poly(ε-caprolactone) Osteoblast cells Polymers
Abstract/Summary
A graded oxidation process, involving UV-ozone (UVO) treatment, was used to create a poly(ε-caprolactone) (PCL) surface with a systematic variation in surface chemistry.
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has proved useful in characterizing the chemical composition of these surfaces and in monitoring the oxidation process. The TOF-SIMS data
correlates with contact angle data and the results of the binding studies performed with mouse calvarial cells. UVO treatment resulted in a PCL surface with improved wettability and cellular
adhesion. © 2002 Elsevier Science B.V. All rights reserved.
Publisher
Elsevier
Date
2003-01-01
Copyright Notice
http://www.nist.gov/public_affairs/disclaim.htm
Journal
Applied Surface Science
Volume
203-204
Pages
855-858
Copyright Agreement
on
Additional Notes
Applied Surface Science 2003, 203-204, 855-858
Guest - January 07, 2009
View Journal Article: Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High-Throughput Characterization of Biosurfaces 