Guest - January 07, 2009 Browse Communities | NEW Participate | Login | Help 

View Journal Article: Near-Field Polarimetric Characterization of Semi-Crystalline Polymer Systems

Citation: Goldie, Scott, Fasolka, Michael, Goldner, Lori, Hwang, Jeeseong and Beers, Kathryn (2003). Near-Field Polarimetric Characterization of Semi-Crystalline Polymer Systems. Polymeric Materials: Science & Engineering 88 (). 145-146.
Collection: Polymer Publications  
 
Attached Files
Name Description MIMEType Size Downloads
Fasolka_et_al_ACS_Poly_Mat_2003.pdf   Fasolka_et_al_ACS_Poly_Mat_2003.pdf application/pdf 548.06KB 0

Title Near-Field Polarimetric Characterization of Semi-Crystalline Polymer Systems
Author(s) Goldie, Scott
Fasolka, Michael
Goldner, Lori
Hwang, Jeeseong
Beers, Kathryn
Keyword(s) combinatorial methods
isotactic polystyrene
iPS
polarization modulation near-field scanning optical microscopy
PM-NSOM
thin films
Abstract/Summary We have studied crystallization in thin films of isotactic polystyrene (iPS) to better understand the morphology and formation of these structures through the use of polarization modulation near-field scanning optical microscopy (PM-NSOM). Polymer crystallites consisting of ordered layers (lamella) of folded chains are grown from amorphous iPS film. While the structure of bulk polymer crystallites (spherulites) is well established,1 a variety of less-understood forms, including dendritic structures, are found in ultra-thin (<100 nm) films. In addition, there are questions regarding how crystallization occurs in these constrained systems where the film thickness is comparable to the polymer chain dimensions. By combining polarimetric techniques with NSOM, we can measure the local linear birefringence (retardance) and the linear dichroism of thin-film samples, which provides quantitative information regarding molecular alignment in thin films with spatial resolution as high as 50 nm. NSOM-generated polarimetric images of polymer crystallites should provide valuable information regarding the mesoscopic morphology of these structures and give clues to their formation.
Publisher American Chemical Society
Date 2003-01-01
Copyright Notice http://www.nist.gov/public_affairs/disclaim.htm
Journal Polymeric Materials: Science & Engineering
Volume 88
Pages 145-146
Copyright Agreement on
Additional Notes Polymeric Materials: Science & Engineering 2003, 88, 145; Scholarship: SNG is grateful to the National Research Council for a National Institute of Standards and Technology Post-doctoral Research Fellowship.
 
 
User Comments
 
Created: Tue, 31 Oct 2006, 00:58:01 EST Detailed History


Kent State University NIST MIT University of Michigan Purdue Iowa State University


About | Terms of Use | Contact | Privacy Policy