Pulsed laser deposition is an extremely effective method of growing thin films of materials on substrates. In this particular experiment the deposition of various pervoskite
molecules onto different substrates were monitored via x-ray diffraction from a synchrotron source. Molecular compounds that were chosen were CaTiO3, SrTiO3, and BaTiO3 due to there structural
similarities and correspondingly different lattice constants. The lattice constants for CaTiO3, SrTiO3, and BaTiO3 are 3.80, 3.90, and 4.06 respectively. These materials all have the same valence
structure. Based upon the intensities of the diffracted x-rays at the anti-Bragg peak position, the growth of the film was monitored on a monolayer by monolayer scale at 750°C. The film quality of
CaTiO3 on SrTiO3 and BaTiO3 on SrTiO3 were compared to a homoepitaxial film of SrTiO3 to determine how the strain at the interface affected growth. It was determined that the tensilely strain film,
CaTiO3, grew more smoothly than the ompressively strained material BaTiO3.
Publisher
Cornell Center for Materials Research
Date
2004-08-17
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Additional Notes
Support for this REU program is provided through the National Science Foundation Materials Research Science and Engineering Centers (MRSEC) Program (DMR-0079992) and the REU-Site
program (DMR-0097494). Additional funding is provided by Cornell University.
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