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View Generic Document: Method Development for the Preparation and Analysis of Polymer Samples Using MALDITOF Mass Spectrometry

Citation: Nishimoto, Bryan (2005). Method Development for the Preparation and Analysis of Polymer Samples Using MALDITOF Mass Spectrometry. National Institute of Standards and Technology, Technology Administration, U.S. Department of Commerce..
Collection: NIST Summer Undergraduate Research Fellowship (SURF) program  
 
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Title Method Development for the Preparation and Analysis of Polymer Samples Using MALDITOF Mass Spectrometry
Author(s) Nishimoto, Bryan
Keyword(s) polymer
mass distribution
chemical composition
mass spectrometry
Abstract/Summary Polymer applications flourish in our modern world. To manufacture polymers with optimum performance properties, information about the mass distribution and chemical composition is vital. Matrix Assisted Laser Desorption Ionization Time of Flight (MALDI-TOF) mass spectrometry provides a method to determine this information accurately and easily. MALDI does not require large samples in order to function properly, and can be used for large molecules. This makes it an excellent way to analyze polymers. However, factors such as sample preparation and introduction, data processing, and instrument parameters significantly influence the outcome of a MALDI-TOF investigation. Examining and optimizing these elements require empirical analysis over a large sample space. The goal of the research is to integrate a high-throughput MALDI sample preparation station, a commercial automated data collection MS, and a semi-automated in-house data processing software into a single, self-operated three stage platform. The data collected from this setup will help to identify the optimal setup for data collection from a polymer sample via MALDI-TOF mass spectrometry and to determine consistent and optimum procedures for handling the data. This presentation will cover my contribution to this project, the data analysis front.
Publisher National Institute of Standards and Technology, Technology Administration, U.S. Department of Commerce.
Date 2005-01-01
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Created: Thu, 21 Sep 2006, 23:54:47 EST Detailed History


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