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View Generic Document: Time Domain Dielectric Spectroscopy Analysis of the Amorphous Phase in Semicrystalline Citation: Conrad, Brian R. (2005). Time Domain Dielectric Spectroscopy Analysis of the Amorphous Phase in Semicrystalline. National Institute of Standards and Technology, Technology Administration, U.S. Department of Commerce.. Collection: NIST Summer Undergraduate Research Fellowship (SURF) program     Attached Files Name Description MIMEType Size Downloads NIST_SURF_2004_conrad.pdf   NIST_SURF_2004_conrad.pdf application/pdf 773.14KB 0 Title Time Domain Dielectric Spectroscopy Analysis of the Amorphous Phase in Semicrystalline Author(s) Conrad, Brian R. Keyword(s) amorphous dielectric crystalization Abstract/Summary The amorphous state of Bisphenol-A Polycarbonate was examined by time-domain dielectric spectroscopy, as a function of crystallization time over a frequency range of 1x10-4 Hz to 1x104 Hz. The dielectric measurements were conducted around the glass transition temperature of Bisphenol-A Polycarbonate. These dielectric studies were performed on a series of samples that were partially melted and recrystallized so as to investigate the influence of secondary crystallization on the α relaxation, thereby probing the effects of crystalline constraints on the cooperative dipole motions in the amorphous fraction. Analysis of the constrained behavior was performed via fitting to the Havriliak-Negami, Vogel-Fulcher-Hesse-Tammann, and Arrhenius equations. Insights and suggestions concerning the amorphous phase’s crystallization dynamics will be briefly discussed. Publisher National Institute of Standards and Technology, Technology Administration, U.S. Department of Commerce. Date 2005-01-01 Copyright Notice http://www.nist.gov/public_affairs/disclaim.htm Copyright Agreement on   User Comments   Created: Thu, 21 Sep 2006, 23:54:47 EST Detailed History

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